Services
Services of Magneto-photonic Laboratory |
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No. |
Service Type |
Description |
1 |
Heat treatment in air at temperatures up to 1200 C0 |
per hour |
2 |
Heat treatment under vacuum at temperatures up to 700 0C - mbar |
per hour |
3 |
Heat treatment under vacuum in inert gas atmosphere at temperatures up to 700 0C |
per hour |
4 |
NIR-VIS-UV spectroscopy |
each test |
5 |
Measurement of Kerr and Faraday effects |
each test |
6 |
Measurement of Hall effect |
each test |
7 |
Measurement of magnetic resistance |
each test |
8 |
Measurement of magnetic impedance up to 15 MHz |
Per 10 frequencies |
9 |
Evaporative deposition |
The required materials are provided by applicant |
10 |
Evaporative deposition |
The required materials are provided by laboratory |
11 |
Spin Coating |
The required materials are provided by applicant |
12 |
Spin Coating |
The required materials are provided by laboratory |
13 |
Electrochemical deposition |
The required materials are provided by applicant |
14 |
Electrochemical deposition |
The required materials are provided by laboratory |
15 |
Target preparation from basic solid materials |
The required materials are provided by applicant |
16 |
Target preparation from basic solid materials |
The required materials are provided by laboratory |
Services of Magneto-plasmonic Laboratory |
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No. |
Service Type |
Description |
1 |
Hysteresis loop measurement of magneto-optical responses such as Faraday and Kerr rotations |
per data registration for each sample |
2 |
Measurement of spectral responses of magneto-optical samples in Faraday and Kerr configurations |
per data registration for each sample |
3 |
Measurement of magneto-electrical response of samples |
per data registration for each sample |
4 |
Laser deposition of oxide and non-oxide samples in alloy composition |
Deposition of each sample |
5 |
Electron beam deposition |
Deposition of each sample |
6 |
Thermal deposition |
Deposition of each sample |
7 |
Response registration of magnetic and non-magnetic circular dichroism |
Per sample |
8 |
Optical thickness measurement |
Per sample |
9 |
Nanosecond laser spectroscopy |
Per sample |
Services of Laboratory of Optical Active Devices |
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No. |
Service Type |
Description |
1 |
Insertion Loss |
Per sample |
2 |
Return loss |
Per sample |
3 |
Wavelength Dependent Insertion Loss |
Per sample |
4 |
Wavelength Dependent Return Loss |
Per sample |
5 |
Polarization Dependent Loss |
Per sample |
6 |
Polarization Dependence Return Loss |
Per sample |
7 |
Directivity |
Per sample |
8 |
Crosstalk |
Per sample |
9 |
OTDR (per core) |
Per sample |
10 |
Optical Gain |
Per sample |
11 |
Gain Flatness |
Per sample |
12 |
Noise Figure |
Per sample |
13 |
Polarization Dependent Gain |
Per sample |
14 |
Optical Signal-to-Noise Ratio |
Per sample |
15 |
Chromatic Dispersion |
Per sample |
16 |
Group Delay |
Per sample |
17 |
Polarization-Mode Dispersion |
Per sample |
18 |
PDL |
Per sample |
19 |
Differential Group Delay |
Per sample |
20 |
WDL |
Per sample |
21 |
Bit Error Rate |
Per sample |
22 |
Extinction Ratio |
Per sample |
23 |
Rise /Fall Time |
Per sample |
24 |
Jitter |
Per sample |
25 |
Signal to Noise Ratio |
Per sample |
26 |
Optical Modulation Amplitude |
Per sample |
27 |
Transfer Bit Rate |
Per sample |
28 |
Cold |
Per hour |
29 |
Damp Heat |
Per hour |
30 |
Dry Heat |
Per hour |
31 |
Temperature-Humidity Cyclic Test |
Per hour |
32 |
Thermal Shock |
Per hour |
Services of Plasma Laboratory |
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No. |
Service Type |
Description |
1 |
Gas chromatography (GC) |
Per sample |
2 |
Deposition and processing with RF (1) |
Per sample (<2min) |
3 |
Deposition and processing with RF (2) |
Per sample (2-5 min) |
4 |
Ellipsometry |
Per sample |
5 |
Atomic Force Microscopy (AFM) |
Per sample |
6 |
ATR |
Per sample |
7 |
OES |
Per run |
8 |
Contact Angle |
Per hour |
Services of Laboratory of Organic and Polymeric Materials |
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No. |
Service Type |
Description |
1 |
Spectroscopy (transmission/ absorption) |
Dependent on the characteristics of film assuming that the material is prepared |
2 |
Spectroscopy (transmission/ absorption) |
Dependent on the characteristics of film assuming that the material is prepared |
3 |
Reflection spectroscopy |
Dependent on the characteristics of film assuming that the material is prepared |
4 |
Reflection spectroscopy |
Dependent on the characteristics of film assuming that the material is prepared |
5 |
Photoluminescence refection spectroscopy |
Dependent on the material and film type |
6 |
Spin coating (1) |
Dependent on the material and film type |
7 |
Spin coating (2) |
Dependent on sample |
8 |
Deep coating (1) |
Dependent on sample |
9 |
Deep coating (2) |
Dependent on sample |
10 |
Evaporative coating |
Dependent on sample |
11 |
Sample preparation for coating (1) |
Dependent on sample |
12 |
Sample preparation for coating (2) |
Using z-scan configuration |
13 |
Investigation of induced anisotropy (1) |
Using z-scan configuration |
14 |
Investigation of induced anisotropy (2) |
Using z-scan configuration |
15 |
Investigation of induced anisotropy (3) |
Dependent on the sample and desired number of images |
16 |
Resistance measurement of thin films (1) |
Dependent on the sample and desired number of images |
17 |
Resistance measurement of thin films (2) |
Dependent on the sample and time involved |
18 |
Refractive index and nonlinear absorption coefficient measurement (1) |
Dependent on the sample and time involved |
19 |
Refractive index and nonlinear absorption coefficient measurement (2) |
Dependent on the sample |
20 |
Refractive index and nonlinear absorption coefficient measurement (3) |
Dependent on the sample |
21 |
Sample analysis by transmitted light microscopy (1) |
Dependent on the sample |
22 |
Sample analysis by transmitted light microscopy (2) |
Dependent on the sample and desired number of images |
23 |
Ultrasonic bath |
Dependent on the sample and desired number of images |
24 |
Ultrasonic bath |
Perform optical design and specific configuration for measuring the desired parameter |
25 |
Polymeric films (1) poling |
Dependent on the characteristics of film assuming that the material is prepared |
26 |
Polymeric films (2) poling |
Dependent on the characteristics of film assuming that the material is prepared |
27 |
Polymeric films (3) poling |
Dependent on the characteristics of film assuming that the material is prepared |
28 |
Magnetic stirrer (mixer) |
Dependent on the characteristics of film assuming that the material is prepared |
29 |
Magnetic stirrer (mixer) |
Dependent on the material and film type |
30 |
Measurement of specific optical parameter of sample |
Dependent on the material and film type |
Services of Laboratory of Solid-State Laser and its Applications |
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No. |
Service Type |
Description |
1 |
Power measurement with laser energy |
Per measurement |
2 |
Profile registration of Laser ray |
Per sample |
3 |
Use of nanosecond pulse YAG laser with power of 200 milijoule |
Per hour |
4 |
Use of nanosecond pulse YAG laser with power of 500 milijoule |
Per hour |
5 |
Use of femtosecond laser with nanojoule energy |
Per hour |
6 |
Ordinary fiber welding |
Per number |
7 |
Fiber welding PM |
Per number |
8 |
Use of class 10, 000 clean room with the area of 20 m2 |
Per day |
9 |
Use of fiber laser with power of 50 watt |
Per hour |
10 |
Other services related to use of laser sources |
- |
Services of Laboratory of Laser Spectroscopy |
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No. |
Service Type |
Description |
1 |
Presentation of LIBS spectrum of solid samples |
Per sample |
2 |
Presentation of LIBS spectrum of liquid and gas samples |
Per sample |
3 |
Deep elemental analysis |
Per sample |
4 |
Laser pulse radiation on sample |
Per pulse |
5 |
Presentation of absorption, transmission and reflection spectrum |
Per sample |
6 |
Radiation measurement in the spectral region |
Per sample |
7 |
Presentation of Raman/LIF spectrum |
Per sample |