Services
Services of Magneto-photonic Laboratory
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| NO. Service Type | Description |
| 1 Heat treatment in air at temperatures up to 1200 C0 | per hour |
| 2 Heat treatment under vacuum at temperatures up to 700 0C - mbar | per hour |
| 3 Heat treatment under vacuum in inert gas atmosphere at temperatures up to 700 0C | per hour |
| 4 NIR-VIS-UV spectroscopy | each test |
| 5 Measurement of Kerr and Faraday effects | each test |
| 6 Measurement of Hall effect | each test |
| 7 Measurement of magnetic resistance | each test |
| 8 Measurement of magnetic impedance up to 15 MHz | Per 10 frequencies |
| 9 Evaporative deposition | The required materials are provided by applicant |
| 10 Evaporative deposition | The required materials are provided by laboratory |
| 11 Spin Coating | The required materials are provided by applicant |
| 12 Spin Coating | The required materials are provided by laboratory |
| 13 Electrochemical deposition | The required materials are provided by applicant |
| 14 Electrochemical deposition | The required materials are provided by laboratory |
| 15 Target preparation from basic solid materials | The required materials are provided by applicant |
| 16 Target preparation from basic solid materials | The required materials are provided by laboratory |
Services of Magneto-plasmonic Laboratory
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| No. Service Type | Description |
| 1 Hysteresis loop measurement of magneto-optical responses such as Faraday and Kerr rotations | per data registration for each sample |
| 2 Measurement of spectral responses of magneto-optical samples in Faraday and Kerr configurations | per data registration for each sample |
| 3 Measurement of magneto-electrical response of samples | per data registration for each sample |
| 4 Laser deposition of oxide and non-oxide samples in alloy composition | Deposition of each sample |
| 5 Electron beam deposition | Deposition of each sample |
| 6 Thermal deposition | Deposition of each sample |
| 7 Response registration of magnetic and non-magnetic circular dichroism | Per sample |
| 8 Optical thickness measurement | Per sample |
| 9 Nanosecond laser spectroscopy | Per sample |
Services of Laboratory of Optical Active Devices
| No. | Service Type | Description |
|---|---|---|
| 1 | Insertion Loss | Per sample |
| 2 | Return loss | Per sample |
| 3 | Wavelength Dependent Insertion Loss | Per sample |
| 4 | Wavelength Dependent Return Loss | Per sample |
| 5 | Polarization Dependent Loss | Per sample |
| 6 | Polarization Dependence Return Loss | Per sample |
| 7 | Directivity | Per sample |
| 8 | Crosstalk | Per sample |
| 9 | OTDR (per core) | Per sample |
| 10 | Optical Gain | Per sample |
| 11 | Gain Flatness | Per sample |
| 12 | Noise Figure | Per sample |
| 13 | Polarization Dependent Gain | Per sample |
| 14 | Optical Signal-to-Noise Ratio | Per sample |
| 15 | Chromatic Dispersion | Per sample |
| 16 | Group Delay | Per sample |
| 17 | Polarization-Mode Dispersion | Per sample |
| 18 | PDL | Per sample |
| 19 | Differential Group Delay | Per sample |
| 20 | WDL | Per sample |
| 21 | Bit Error Rate | Per sample |
| 22 | Extinction Ratio | Per sample |
| 23 | Rise /Fall Time | Per sample |
| 24 | Jitter | Per sample |
| 25 | Signal to Noise Ratio | Per sample |
| 26 | Optical Modulation Amplitude | Per sample |
| 27 | Transfer Bit Rate | Per sample |
| 28 | Cold | Per hour |
| 29 | Damp Heat | Per hour |
| 30 | Dry Heat | Per hour |
| 31 | Temperature-Humidity Cyclic Test | Per hour |
| 32 | Thermal Shock | Per hour |
Services of Plasma Laboratory
| No. | Service Type | Description |
|---|---|---|
| 1 | Gas chromatography (GC) | Per sample |
| 2 | Deposition and processing with RF (1) | Per sample (<2min) |
| 3 | Deposition and processing with RF (2) | Per sample (2-5 min) |
| 4 | Ellipsometry | Per sample |
| 5 | Atomic Force Microscopy (AFM) | Per sample |
| 6 | ATR | Per sample |
| 7 | OES | Per run |
| 8 | Contact Angle | Per hour |
Services of Laboratory of Organic and Polymeric Materials
| No. | Service Type | Description |
|---|---|---|
| 1 | Spectroscopy (transmission/ absorption) | Dependent on the characteristics of film assuming that the material is prepared |
| 2 | Spectroscopy (transmission/ absorption) | Dependent on the characteristics of film assuming that the material is prepared |
| 3 | Reflection spectroscopy | Dependent on the characteristics of film assuming that the material is prepared |
| 4 | Reflection spectroscopy | Dependent on the characteristics of film assuming that the material is prepared |
| 5 | Photoluminescence refection spectroscopy | Dependent on the material and film type |
| 6 | Spin coating (1) | Dependent on the material and film type |
| 7 | Spin coating (2) | Dependent on sample |
| 8 | Deep coating (1) | Dependent on sample |
| 9 | Deep coating (2) | Dependent on sample |
| 10 | Evaporative coating | Dependent on sample |
| 11 | Sample preparation for coating (1) | Dependent on sample |
| 12 | Sample preparation for coating (2) | Using z-scan configuration |
| 13 | Investigation of induced anisotropy (1) | Using z-scan configuration |
| 14 | Investigation of induced anisotropy (2) | Using z-scan configuration |
| 15 | Investigation of induced anisotropy (3) | Dependent on the sample and desired number of images |
| 16 | Resistance measurement of thin films (1) | Dependent on the sample and desired number of images |
| 17 | Resistance measurement of thin films (2) | Dependent on the sample and time involved |
| 18 | Refractive index and nonlinear absorption coefficient measurement (1) | Dependent on the sample and time involved |
| 19 | Refractive index and nonlinear absorption coefficient measurement (2) | Dependent on the sample |
| 20 | Refractive index and nonlinear absorption coefficient measurement (3) | Dependent on the sample |
| 21 | Sample analysis by transmitted light microscopy (1) | Dependent on the sample |
| 22 | Sample analysis by transmitted light microscopy (2) | Dependent on the sample and desired number of images |
| 23 | Ultrasonic bath | Dependent on the sample and desired number of images |
| 24 | Ultrasonic bath | Perform optical design and specific configuration for measuring the desired parameter |
| 25 | Polymeric films (1) poling | Dependent on the characteristics of film assuming that the material is prepared |
| 26 | Polymeric films (2) poling | Dependent on the characteristics of film assuming that the material is prepared |
| 27 | Polymeric films (3) poling | Dependent on the characteristics of film assuming that the material is prepared |
| 28 | Magnetic stirrer (mixer) | Dependent on the characteristics of film assuming that the material is prepared |
| 29 | Magnetic stirrer (mixer) | Dependent on the material and film type |
| 30 | Measurement of specific optical parameter of sample | Dependent on the material and film type |
Services of Laboratory of Solid-State Laser and its Applications
| No. | Service Type | Description |
|---|---|---|
| 1 | Power measurement with laser energy | Per measurement |
| 2 | Profile registration of Laser ray | Per sample |
| 3 | Use of nanosecond pulse YAG laser with power of 200 milijoule | Per hour |
| 4 | Use of nanosecond pulse YAG laser with power of 500 milijoule | Per hour |
| 5 | Use of femtosecond laser with nanojoule energy | Per hour |
| 6 | Ordinary fiber welding | Per number |
| 7 | Fiber welding PM | Per number |
| 8 | Use of class 10, 000 clean room with the area of 20 m2 | Per day |
| 9 | Use of fiber laser with power of 50 watt | Per hour |
| 10 | Other services related to use of laser sources | - |
Services of Laboratory of Laser Spectroscopy
| No. | Service Type | Description |
|---|---|---|
| 1 | Presentation of LIBS spectrum of solid samples | Per sample |
| 2 | Presentation of LIBS spectrum of liquid and gas samples | Per sample |
| 3 | Deep elemental analysis | Per sample |
| 4 | Laser pulse radiation on sample | Per pulse |
| 5 | Presentation of absorption, transmission and reflection spectrum | Per sample |
| 6 | Radiation measurement in the spectral region | Per sample |
| 7 | Presentation of Raman/LIF spectrum | Per sample |